Effects of soft X-ray irradiation on solid-state imagers

Allinson, N. M., Allsopp, D. W. E., Quayle, J. A. and Magorrian, B. G. (1991) Effects of soft X-ray irradiation on solid-state imagers. Nuclear Instruments and Methods in Physics Research: A, 310 (1-2). pp. 267-272. ISSN 0168-9002

Full content URL: http://dx.doi.org/10.1016/0168-9002(91)91041-S

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Item Type:Article
Item Status:Live Archive


The visible effects of soft X-ray damage in solid-state imagers are changes in the flat-band voltages, degradation in charge transfer efficiency and increased dark current. Details of these effects, and possible underlying mechanisms, are discussed. Deep level transient spectroscopy is introduced as a useful tool for identifying existing and radiation-induced trapping centres in charge-coupled devices. The effects of various annealing methods for charge-coupled and photodiode imagers are presented. © 1991.

Subjects:F Physical Sciences > F350 Medical Physics
Divisions:College of Science > School of Computer Science
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ID Code:8619
Deposited On:07 May 2013 10:59

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