High dynamic range active pixel sensor

Anaxagoras, Thalis and Allinson, Nigel (2004) High dynamic range active pixel sensor. In: Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V, 19-21 January 2004, San Jose, CA; United States.

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Item Type:Conference or Workshop contribution (Paper)
Item Status:Live Archive


A new pixel structure for high dynamic range imaging is proposed. The internal pixel circuit resets the pixel each time the well capacity nears saturation and a counter, implemented in the pixel itself (or in an external memory), records the number of resets per integration time. The increase in the dynamic range is given by a factor of (m + 1) where m is the number of internal resets per integration time. The peak signal-to-noise ratio will be increased due to the effective increase in the well capacity. A multiple sampling technique can be used in the combination with this proposed structure to achieve a further increase in dynamic range.

Keywords:CMOS integrated circuits, Image analysis, Image quality, Imaging techniques, Light scattering, Optical filters, Sampling, Signal to noise ratio, Active pixel sensor, High dynamic range, Saturation voltage, Standard deviations (STD), Image sensors
Subjects:G Mathematical and Computer Sciences > G400 Computer Science
G Mathematical and Computer Sciences > G740 Computer Vision
Divisions:College of Science > School of Computer Science
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ID Code:8562
Deposited On:17 Apr 2013 13:42

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