Liu, Mingyu, Cheung, Chi Fai, Senin, Nicola , Wang, Shixiang, Su, Rong and Leach, Richard (2020) On-machine surface defect detection using light scattering and deep learning. JOSA A, 37 (9). B53-B59. ISSN 1084-7529
Full content URL: https://doi.org/10.1364/JOSAA.394102
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JOSA-A-f3.pdf - Whole Document Available under License Creative Commons Attribution 4.0 International. 601kB |
Item Type: | Article |
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Item Status: | Live Archive |
Abstract
This paper presents an on-machine surface defect detection system using light scattering and deep learning. A supervised deep learning model is used to mine the information related to defects from light scattering patterns. A convolutional neural network is trained on a large dataset of scattering patterns that are predicted by a rigorous forward scattering model. The model is valid for any surface topography with homogeneous materials and has been verified by comparing with experimental data. Once the neural network is trained, it allows for fast, accurate and robust defect detection. The system capability is validated on micro-structured surfaces produced by ultra-precision diamond machining.
Keywords: | On-machine, defect detection, light scattering, deep learning |
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Subjects: | H Engineering > H700 Production and Manufacturing Engineering |
Divisions: | College of Science > School of Engineering |
ID Code: | 53924 |
Deposited On: | 03 Jul 2023 09:50 |
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