Allinson, N. M., Allsopp, D. W. E., Quayle, J. A. and Magorrian, B. G. (1991) Effects of soft X-ray irradiation on solid-state imagers. Nuclear Instruments and Methods in Physics Research: A, 310 (1-2). pp. 267-272. ISSN 0168-9002
Full content URL: http://dx.doi.org/10.1016/0168-9002(91)91041-S
Full text not available from this repository.
| Item Type: | Article |
|---|---|
| Item Status: | Live Archive |
Abstract
The visible effects of soft X-ray damage in solid-state imagers are changes in the flat-band voltages, degradation in charge transfer efficiency and increased dark current. Details of these effects, and possible underlying mechanisms, are discussed. Deep level transient spectroscopy is introduced as a useful tool for identifying existing and radiation-induced trapping centres in charge-coupled devices. The effects of various annealing methods for charge-coupled and photodiode imagers are presented. © 1991.
| Keywords: | X-ray |
|---|---|
| Subjects: | F Physical Sciences > F350 Medical Physics |
| Divisions: | College of Science > School of Computer Science |
| Related URLs: | |
| ID Code: | 8619 |
| Deposited On: | 07 May 2013 10:59 |
Repository Staff Only: item control page