Noise effects in solid-state imagers

Allinson, Nigel (1987) Noise effects in solid-state imagers. In: Colloquium on Noise in Images, 29 January 1987, London.

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Item Type:Conference or Workshop contribution (Paper)
Item Status:Live Archive

Abstract

This paper introduces the sources and effects of noise in solid-state imagers, both charge-coupled device (CCD) and photodiode (PD) based. Noise sources, both stochastic and deterministic, can be classified according to their origins as input, storage, transport or read-out. Some of these sources depend on fundamental 'physics', but others are affected by the choice of device or by non-standard modes of operation.

Keywords:Semiconductor Devices, Charge Coupled, Semiconductor diodes photodiode - noise spurious signal, Stochastic noise sources image sensors
Subjects:G Mathematical and Computer Sciences > G400 Computer Science
H Engineering > H600 Electronic and Electrical Engineering
Divisions:College of Science > School of Computer Science
ID Code:8636
Deposited On:08 May 2013 15:45

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