Soft X-ray damage in CCD detectors

Magorrian, B. G. and Allinson, N. M. (1988) Soft X-ray damage in CCD detectors. Nuclear Instruments and Methods in Physics Research, A, 273 (2-3). pp. 599-604. ISSN 0168-9002

Full content URL: http://dx.doi.org/10.1016/0168-9002(88)90062-9

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Item Type:Article
Item Status:Live Archive

Abstract

CCD imagers suffer damage when exposed to soft X-ray irradiation, which limits their application in high photon flux environments. This damage manifests itself as increased dark current and reduced charge transfer efficiency. For conventional devices, significant damage is manifest after ∼105 rad exposure. This paper discusses the origins of this damage, the fabrication of radiation-hard devices, and details a series of post-radiation annealing experiments. High temperature annealing in molecular hydrogen has yielded encouraging results in a representative sample of devices. The effect of repeated irradiation-annealing cycles is discussed. © 1988

Keywords:Aging of Materials, Semiconductor Devices, Charge Coupled, X-Rays--Measurements, Charge Coupled Devices, Degradation, Hardening, X-Ray Damage, Particle Detectors
Subjects:F Physical Sciences > F350 Medical Physics
Divisions:College of Science > School of Life Sciences
ID Code:8633
Deposited On:07 May 2013 11:04

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