Characterisation of soft X-ray damage in charge coupled devices

Allinson, Nigel and Allsopp, Duncan W. E. and Magorrian, Brian G. and Quayle, Alan (1990) Characterisation of soft X-ray damage in charge coupled devices. In: Charge-Coupled Devices and Solid State Optical Sensors, 12-14 February 1990, Santa Clara, CA, USA.

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Item Type:Conference or Workshop contribution (Paper)
Item Status:Live Archive

Abstract

There is considerable interest in the effects of radiation damage on solid-state imagers. The characterisation of trapping centres in charge coupled device (CCD) imagers, using Deep Level Transient Spectroscopy (DLTS), is presented. The effects of UV illumination and elevated temperature annealing in a hydrogen-rich environment are also discussed.

Keywords:Image Sensors - Defects, Probability, Signal Processing - Correlation Detectors, Spectroscopy - Transients, X-Rays - Effects, CCD Imagers, Charge Coupled Devices (CCD), Charge Transfer Rate, Deep Level Transient Spectroscopy (DLTS), Soft X Ray Damage, Trapped Charge Emission, Semiconductor Devices, Charge Coupled
Subjects:G Mathematical and Computer Sciences > G400 Computer Science
G Mathematical and Computer Sciences > G740 Computer Vision
Divisions:College of Science > School of Computer Science
ID Code:8623
Deposited On:31 May 2013 09:06

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