Characterisation of a monolithic active pixel sensor for electron detection in the energy range 10-20 keV

Matheson, J. and Moldovan, G. and Clark, A. and Prydderch, M. and Turchetta, R. and Derbyshire, G. and Kirkland, A. and Allinson, Nigel (2009) Characterisation of a monolithic active pixel sensor for electron detection in the energy range 10-20 keV. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 608 (1). pp. 199-205. ISSN 0168-9002

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Abstract

As part of a feasibility study into the use of novel electron detectors for X-ray photoelectron emission microscopes (XPEEM), we have characterised the imaging performance of a back-illuminated monolithic active pixel sensor (MAPS) operating under both integrating and counting modes for electrons in the energy range 10-20 keV. For integrating mode, we present the detective quantum efficiency (DQE), which shows marked improvements over conventional indirect detectors based on microchannel plates. We also present the modulation transfer function (MTF) and noise power spectrum (NPS), again demonstrating significantly improved performance. For counting mode, we present the quantum efficiency (QE) as a function of incident electron energy. We have evaluated the charge collection efficiency (CCE) and we thereby demonstrate the presence of a ~200 nm thick dead layer that is linked with reduced CCE at low electron energies. Based on our findings, we believe that the MAPS technology is well matched to future XPEEM instruments using aberration correction. © 2009 Elsevier B.V. All rights reserved.

Keywords:Aberration correction, Back-illuminated, Characterisation, Charge collection efficiency, Counting mode, Dead layers, Detective quantum efficiency, Electron detection, Electron detectors, Electron energies, Energy ranges, Feasibility studies, Imaging detectors, Imaging performance, Incident electrons, Micro channel plate, Modulation transfer function, Monolithic active pixel sensor, Monolithic active pixel sensors, Noise power spectrum, X-ray photoelectrons, Detectors, Dissociation, Electron energy levels, Electrons, Image sensors, Optical projectors, Pixels, Planning, Power spectrum, Resource allocation, Semiconductor quantum dots, X ray microscopes, Quantum efficiency
Subjects:G Mathematical and Computer Sciences > G400 Computer Science
G Mathematical and Computer Sciences > G740 Computer Vision
Divisions:College of Science > School of Computer Science
ID Code:8545
Deposited On:10 Apr 2013 13:56

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