Characterization and testing of LAS: a prototype 'large area sensor' with performance characteristics suitable for medical imaging applications

Bohndiek, S. E. and Blue, A. and Cabello, J. and Clark, A. T. and Guerrini, N. and Evans, P. M. and Harris, E. J. and Konstantinidis, A. and Maneuski, D. and Osmond, J. and O'Shea, V. and Speller, R. D. and Turchetta, R. and Wells, K. and Zin, H. and Allinson, Nigel (2009) Characterization and testing of LAS: a prototype 'large area sensor' with performance characteristics suitable for medical imaging applications. IEEE Transactions on Nuclear Science, 56 (5). pp. 2938-2946. ISSN 0018-9499

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Item Type:Article
Item Status:Live Archive

Abstract

The Large Area Sensor (LAS) is a 1350 x 1350 array of active pixels on a 40m pitch fabricated in a 0.35m CMOS process. Stitching technology is employed to achieve an area of 5.4 cm x 5.4 cm. The sensor includes 'regions of reset', whereby three different integration times can be set on the array to achieve a large imaging range for static scenes. Characterization of the noise performance included temporal and fixed pattern sources. LAS was found to have a read noise of 62 e -, a full well capacity of 61 x 10 3 e - and a conversion gain of 5 e - per digital number (DN). The fixed pattern noise (FPN) was evaluated at half saturation; within a single stitched section of the array, column-to-column FPN was found to be 0.6, while the pixel-to-pixel FPN was 3. Both FPN sources were found to be gain related and could be corrected via flat fielding. Based on the results of characterization, LAS was coupled to a structured CsI:Tl scintillator and included in an X-ray diffraction system developed for the analysis of breast biopsy samples. Data acquired with plastic test objects agrees with that acquired by a previous prototype sensor. It is demonstrated that an imaging output range of 140 dB can be achieved using integration times of 0.1 ms to record the transmitted X-ray beam and 2.3 s to record the lower intensity scattered radiation. © 2009 IEEE.

Keywords:Active pixel, Breast biopsies, Characterization and testing, CMOS, CMOS processs, Conversion gain, Digital numbers, Fixed pattern noise, Full well capacity, Large area sensors, Noise performance, Output range, Performance characteristics, Prototype sensor, Read noise, Scattered radiations, Test object, X ray beam, X-ray diffraction system, Digital image storage, Image sensors, Lithium alloys, Medical imaging, Semiconductor device manufacture, Semiconductor switches, X ray diffraction, X ray diffraction analysis, Pixels
Subjects:G Mathematical and Computer Sciences > G400 Computer Science
G Mathematical and Computer Sciences > G740 Computer Vision
Divisions:College of Science > School of Computer Science
ID Code:8544
Deposited On:10 Apr 2013 15:18

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