eLeNA: a parametric CMOS active-pixel sensor for the evaluation of reset noise reduction architectures

Anaxagoras, Thalis and Kent, Paul and Allinson, Nigel and Turchetta, Renato and Pickering, Tim and Maneuski, Dzmitry and Blue, Andrew and O'Shea, Val (2010) eLeNA: a parametric CMOS active-pixel sensor for the evaluation of reset noise reduction architectures. IEEE Transactions on Electron Devices, 57 (9). 2163-2175 . ISSN 0018-9383

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eLeNA: a parammetric CMOS active-pixel sensor for the evaluation of reset noise reduction architectures
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Official URL: http://dx.doi.org/10.1109/TED.2010.2052418

Abstract

We present a novel complementary metal-oxide-semiconductor (CMOS) active-pixel sensor imager that incorporates different reset schemes to achieve lower reset noise levels. The sensor, eLeNA, features a 448 × 512 array with a pixel pitch of 15 μm, fabricated using a 0.18- μm CMOS process. Fourteen sections and five different reset methods were employed. Without using pinned diodes, we implanted structures for correlated double sampling. A noise of 6 e- is measured with a conversion gain of 49 μV/e-. We will discuss various applications for the reset method that achieved the best overall performance, considering leakage current and read noise.

Item Type:Article
Keywords:CMOS image sensors, CMOS process, Gain measurement, Noise level, Noise measurement, Noise reduction, Sampling methods, Sensor arrays, Sensor phenomena and characterization
Subjects:H Engineering > H611 Microelectronic Engineering
Divisions:College of Science > School of Computer Science
ID Code:6145
Deposited By: Nigel Allinson
Deposited On:15 Sep 2012 21:24
Last Modified:04 Dec 2013 16:55

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