A closed-loop IGBT non-destructive tester

Ahmed, Amr and Shadrokh, Y. and Coulbeck, L. and Castellazzi, A. and Johnson, C. M. (2012) A closed-loop IGBT non-destructive tester. Microelectronics Reliability, 52 (9-10). pp. 2358-2362. ISSN 0026-2714

Full content URL: http://dx.doi.org/10.1016/j.microrel.2012.06.108

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Item Type:Article
Item Status:Live Archive

Abstract

Non-destructive testing capability is a very important aspect of power device technology evolution towards more robust and reliable products. This paper proposes a closed-loop non-destructive tester for high power multi-chip IGBT modules. Other than proposed elsewhere in the past, the solution put forward here includes the possibility to be used in closed-loop, by proper identification and monitoring of representative pre-failure signatures to automatically trigger the activation of a protective switch and prevent the failure of the device under test. The advantage is that devices of different characteristics (e.g., voltage range, type) can be tested without having to set a specific intervention delay for the protection circuit. © 2012 Elsevier Ltd. All rights reserved.

Keywords:Closed-loop, Device under test, High-power, Multi-chip, Non destructive, Non destructive testing, Power devices, Protection circuits, Voltage ranges, Magnetic materials, Microelectronics, Nondestructive examination
Subjects:H Engineering > H600 Electronic and Electrical Engineering
Divisions:College of Science > School of Computer Science
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ID Code:10910
Deposited On:14 Feb 2014 14:03

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